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Chapter title |
An Approach for Detection of Node Displacement Fault (NDF) in Reversible Circuit
|
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Chapter number | 50 |
Book title |
VLSI Design and Test
|
Published by |
Springer, Singapore, July 2019
|
DOI | 10.1007/978-981-32-9767-8_50 |
Book ISBNs |
978-9-81-329766-1, 978-9-81-329767-8
|
Authors |
Bappaditya Mondal, Anirban Bhattacharjee, Subham Saha, Shalini Parekh, Chandan Bandyopadhyay, Hafizur Rahaman, Mondal, Bappaditya, Bhattacharjee, Anirban, Saha, Subham, Parekh, Shalini, Bandyopadhyay, Chandan, Rahaman, Hafizur |