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Mendeley readers
| Chapter title |
Probabilistic Verification for Reliable Network-on-Chip System Design
|
|---|---|
| Chapter number | 7 |
| Book title |
Formal Methods for Industrial Critical Systems
|
| Published by |
Springer, Cham, August 2019
|
| DOI | 10.1007/978-3-030-27008-7_7 |
| Book ISBNs |
978-3-03-027007-0, 978-3-03-027008-7
|
| Authors |
Benjamin Lewis, Arnd Hartmanns, Prabal Basu, Rajesh Jayashankara Shridevi, Koushik Chakraborty, Sanghamitra Roy, Zhen Zhang, Lewis, Benjamin, Hartmanns, Arnd, Basu, Prabal, Jayashankara Shridevi, Rajesh, Chakraborty, Koushik, Roy, Sanghamitra, Zhang, Zhen |
Mendeley readers
The data shown below were compiled from readership statistics for 3 Mendeley readers of this research output. Click here to see the associated Mendeley record.
Geographical breakdown
| Country | Count | As % |
|---|---|---|
| Unknown | 3 | 100% |
Demographic breakdown
| Readers by professional status | Count | As % |
|---|---|---|
| Researcher | 1 | 33% |
| Other | 1 | 33% |
| Lecturer > Senior Lecturer | 1 | 33% |
| Readers by discipline | Count | As % |
|---|---|---|
| Engineering | 2 | 67% |
| Unknown | 1 | 33% |