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Uncertainty of S-Parameter Measurements on PCBs due to Imperfections in the TRL Line Standard

Overview of attention for article published in Journal of Electromagnetic Engineering and Science, November 2021
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Title
Uncertainty of S-Parameter Measurements on PCBs due to Imperfections in the TRL Line Standard
Published in
Journal of Electromagnetic Engineering and Science, November 2021
DOI 10.26866/jees.2021.5.r.45
Authors

Hyunji Koo, Martin Salter, No-Weon Kang, Nick Ridler, Young-Pyo Hong

Mendeley readers

Mendeley readers

The data shown below were compiled from readership statistics for 2 Mendeley readers of this research output. Click here to see the associated Mendeley record.

Geographical breakdown

Country Count As %
Unknown 2 100%

Demographic breakdown

Readers by professional status Count As %
Student > Doctoral Student 1 50%
Unknown 1 50%
Readers by discipline Count As %
Engineering 1 50%
Unknown 1 50%