↓ Skip to main content

Mechanical Stress Stability of Flexible Amorphous Zinc Tin Oxide Thin-Film Transistors

Overview of attention for article published in Frontiers in Electronics, December 2021
Altmetric Badge

Mentioned by

twitter
1 X user

Readers on

mendeley
2 Mendeley
You are seeing a free-to-access but limited selection of the activity Altmetric has collected about this research output. Click here to find out more.
Title
Mechanical Stress Stability of Flexible Amorphous Zinc Tin Oxide Thin-Film Transistors
Published in
Frontiers in Electronics, December 2021
DOI 10.3389/felec.2021.797308
Authors

Oliver Lahr, Max Steudel, Holger von Wenckstern, Marius Grundmann

X Demographics

X Demographics

The data shown below were collected from the profile of 1 X user who shared this research output. Click here to find out more about how the information was compiled.
Mendeley readers

Mendeley readers

The data shown below were compiled from readership statistics for 2 Mendeley readers of this research output. Click here to see the associated Mendeley record.

Geographical breakdown

Country Count As %
Unknown 2 100%

Demographic breakdown

Readers by professional status Count As %
Student > Doctoral Student 1 50%
Unknown 1 50%
Readers by discipline Count As %
Physics and Astronomy 1 50%
Unknown 1 50%