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Mendeley readers
| Title |
Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications
|
|---|---|
| Published by |
Springer Netherlands, October 2013
|
| DOI | 10.1007/978-94-007-7663-0 |
| ISBNs |
978-9-40-077662-3, 978-9-40-077663-0
|
| Authors |
Franco, Jacopo, Kaczer, Ben, Groeseneken, Guido |
Mendeley readers
The data shown below were compiled from readership statistics for 37 Mendeley readers of this research output. Click here to see the associated Mendeley record.
Geographical breakdown
| Country | Count | As % |
|---|---|---|
| Unknown | 37 | 100% |
Demographic breakdown
| Readers by professional status | Count | As % |
|---|---|---|
| Student > Ph. D. Student | 15 | 41% |
| Student > Master | 4 | 11% |
| Student > Bachelor | 3 | 8% |
| Student > Doctoral Student | 3 | 8% |
| Professor | 2 | 5% |
| Other | 5 | 14% |
| Unknown | 5 | 14% |
| Readers by discipline | Count | As % |
|---|---|---|
| Engineering | 22 | 59% |
| Computer Science | 2 | 5% |
| Physics and Astronomy | 2 | 5% |
| Materials Science | 2 | 5% |
| Arts and Humanities | 1 | 3% |
| Other | 1 | 3% |
| Unknown | 7 | 19% |