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Mendeley readers
| Chapter title |
Channel Hot Carriers and Other Reliability Mechanisms
|
|---|---|
| Chapter number | 6 |
| Book title |
Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications
|
| Published by |
Springer, Dordrecht, January 2014
|
| DOI | 10.1007/978-94-007-7663-0_6 |
| Book ISBNs |
978-9-40-077662-3, 978-9-40-077663-0
|
| Authors |
Jacopo Franco, Ben Kaczer, Guido Groeseneken |
Mendeley readers
The data shown below were compiled from readership statistics for 2 Mendeley readers of this research output. Click here to see the associated Mendeley record.
Geographical breakdown
| Country | Count | As % |
|---|---|---|
| Unknown | 2 | 100% |
Demographic breakdown
| Readers by professional status | Count | As % |
|---|---|---|
| Student > Ph. D. Student | 1 | 50% |
| Student > Master | 1 | 50% |
| Readers by discipline | Count | As % |
|---|---|---|
| Computer Science | 1 | 50% |
| Engineering | 1 | 50% |