A Naïve-Bayes classifier for damage detection in engineering materials

Overview of attention for article published in Materials and Design, January 2007

Altmetric Badge

Mentioned by

patent: 1 patent

Citations

dimensions_citation: 49 Dimensions

Readers on

mendeley: 58 Mendeley

Summary Patents Dimensions citations

So far, Altmetric has seen 1 patent that references this research output.

Bridge cluster dynamic evaluation method, device, equipment and readable storage medium

Application CN-113569315-A

China

This page shows the most recent patents that mention this research output.

Click here to find out how to access more activity.