Increasing the Accuracy of the Characterization of a Thin Semiconductor or Dielectric Film on a Substrate from Only One Quasi-Normal Incidence UV/Vis/NIR Reflectance Spectrum of the Sample
Article in Nanomaterials (August 2023)
The most recent citing publications are shown below. View all 9 publications that cite this research output on Dimensions.
Article in Nanomaterials (August 2023)
Article in Advanced Optical Technologies (June 2022)
Article in Journal of Applied Physics (January 2021)