↓ Skip to main content

Gaussian Process Modeling of EEG for the Detection of Neonatal Seizures

Overview of attention for article published in IEEE Transactions on Biomedical Engineering, December 2007
Altmetric Badge

About this Attention Score

  • In the top 25% of all research outputs scored by Altmetric
  • High Attention Score compared to outputs of the same age (80th percentile)
  • Good Attention Score compared to outputs of the same age and source (69th percentile)

Mentioned by

patent
2 patents

Citations

dimensions_citation
52 Dimensions

Readers on

mendeley
86 Mendeley