Cluster-based instance selection for machine classification

Overview of attention for article published in Knowledge and Information Systems, January 2011

Altmetric Badge

About this Attention Score

In the top 25% of all research outputs scored by Altmetric
Among the highest-scoring outputs from this source (#30 of 614)
Good Attention Score compared to outputs of the same age (77th percentile)
Good Attention Score compared to outputs of the same age and source (71st percentile)

Mentioned by

patent: 2 patents

Citations

dimensions_citation: 57 Dimensions

Readers on

mendeley: 34 Mendeley

Summary Patents Dimensions citations

So far, Altmetric has seen 2 patents that reference this research output.

Feature selection for retraining classifiers

Grant US-11334789-B2

United States of America

SAMPLE SELECTION FOR RETRAINING CLASSIFIERS

Application WO-2016149147-A1

World Intellectual Property Organisation (WIPO)

This page shows the most recent patents that mention this research output.

Click here to find out how to access more activity.