Determination of cross-sectional shape of softwood logs from three x-ray projections using an elliptical model

Overview of attention for article published in European Journal of Wood and Wood Products, May 1998

Altmetric Badge

Mentioned by

patent: 2 patents

Summary Patents

So far, Altmetric has seen 2 patents that reference this research output.

Multi-view x-ray imaging of logs

Grant US-6757354-B2

United States of America

Log evaluation using cylindrical projections

Grant US-6597761-B1

United States of America

This page shows the most recent patents that mention this research output.

Click here to find out how to access more activity.