On-Chip Evaluation of Voltage Drops and Fault Occurrence Induced by Si Backside EM Injection
Book chapter (April 2024)
The most recent citing publications are shown below. View all 57 publications that cite this research output on Dimensions.
Book chapter (April 2024)
Article in IET Information Security (March 2024)
Article in ACM Transactions on Design Automation of Electronic Systems (November 2023)