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Three-Dimensional Orientation Microscopy in a Focused Ion Beam–Scanning Electron Microscope: A New Dimension of Microstructure Characterization

Overview of attention for article published in Metallurgical and Materials Transactions A, January 2008
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3 patents

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205 Dimensions

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247 Mendeley
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Summary Patents Dimensions citations
So far, Dimensions has found 205 publications that cite this research output.

205

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