A Basis Illumination Approach to BRDF Measurement

Overview of attention for article published in International Journal of Computer Vision, July 2008

Altmetric Badge

Mentioned by

patent: 1 patent

Citations

dimensions_citation: 35 Dimensions

Readers on

mendeley: 70 Mendeley
citeulike: 1 CiteULike

Summary Patents Dimensions citations

So far, Altmetric has seen 1 patent that references this research output.

Specular object scanner for measuring reflectance properties of objects

Grant US-9562857-B2

United States of America

This page shows the most recent patents that mention this research output.

Click here to find out how to access more activity.