Reliability and failure mode analysis of high-speed 850-nm multi-mode and 795-nm single-mode VCSELs for space applications
Conference proceeding in Proceedings of SPIE--the International Society for Optical Engineering (March 2024)
The most recent citing publications are shown below. View all 7 publications that cite this research output on Dimensions.
Reliability and failure mode analysis of high-speed 850nm oxide-confined multi-mode VCSELs for space applications
Conference proceeding in Proceedings of SPIE--the International Society for Optical Engineering (March 2023)
In-situ observation of lateral AlAs oxidation and dislocation formation in VCSELs
Article in Micron (April 2022)