Time-resolved two photon photoemission electron microscopy

Overview of attention for article published in Applied Physics B, February 2014

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In the top 25% of all research outputs scored by Altmetric
Good Attention Score compared to outputs of the same age (79th percentile)
Good Attention Score compared to outputs of the same age and source (76th percentile)

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patent: 1 patent

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Method and system for generating intense, ultrashort pulses of XUV and soft x-ray…

Grant US-11573478-B2

United States of America

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