Characterization of semiconductor devices and wafer materials via sub-nanosecond time-correlated single-photon counting

Overview of attention for article published in Journal of Applied Spectroscopy, July 2013

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Impact of In Situ Annealing Time on CdTe Polycrystalline Film and Device Performance

Article in Journal of Electronic Materials (November 2018)

Photoluminescence Enhancement in Nanotextured Fluorescent SiC Passivated by Atomic Layer Deposited Al2O3 Films

Article (May 2016)

Time-resolved photoluminescence for self-calibrated injection-dependent minority carrier lifetime measurements in silicon

Article in Journal of Physics D (December 2014)

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