Applying Ontologies to Business and Systems Modelling Techniques and Perspectives: Lessons Learned

Overview of attention for article published in Journal of Database Management (JDM), April 2004

Altmetric Badge

Mentioned by

patent: 1 patent

Citations

dimensions_citation: 27 Dimensions

Readers on

mendeley: 43 Mendeley

Summary Patents Dimensions citations

So far, Altmetric has seen 1 patent that references this research output.

Business rules for configurable metamodels and enterprise impact analysis

Application US-8548938-B2

United States of America

This page shows the most recent patents that mention this research output.

Click here to find out how to access more activity.