Quantitative Trait Loci Mapping of Adult Plant and Seedling Resistance to Stripe Rust (Puccinia striiformis Westend.) in a Multiparent Advanced Generation Intercross Wheat Population

Overview of attention for article published in Frontiers in Plant Science, December 2021

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Quantitative Trait Loci Mapping of Adult Plant and Seedling Resistance to Stripe Rust (Puccinia striiformis Westend.) in a Multiparent Advanced Generation Intercross Wheat Population https://t.co/UIN7osCKbr https://t.co/d5xDMeh7nA

18 Jan 2022

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New Research: Quantitative Trait Loci Mapping of Adult Plant and Seedling Resistance to Stripe Rust (Puccinia striiformis Westend.) in a Multiparent Advanced Generation Intercross Wheat Population: Stripe rust caused by the… https://t.co/4S1WuWcFhu #PlantS

23 Dec 2021

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