Improving automated visual fault inspection for semiconductor manufacturing using a hybrid multistage system of deep neural networks

Overview of attention for article published in Journal of Intelligent Manufacturing, January 2022

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In the top 25% of all research outputs scored by Altmetric
One of the highest-scoring outputs from this source (#1 of 647)
High Attention Score compared to outputs of the same age (87th percentile)
High Attention Score compared to outputs of the same age and source (99th percentile)

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twitter: 1 X user

Citations

dimensions_citation: 27 Dimensions

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mendeley: 32 Mendeley

Summary News X Dimensions citations

So far, Dimensions has found 27 publications that cite this research output.

27

The most recent citing publications are shown below. View all 27 publications that cite this research output on Dimensions.

Hybrid Semiconductor Wafer Inspection Framework via Autonomous Data Annotation

Article in Journal of Manufacturing Science and Engineering (May 2024)

Leveraging computer vision towards high-efficiency autonomous industrial facilities

Article in Journal of Intelligent Manufacturing (May 2024)

Quality evaluation modeling of a DED-processed metallic deposition based on ResNet-50 with few training data

Article in Journal of Intelligent Manufacturing (April 2024)

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