A high throughput approach for analysis of cell nuclear deformability at single cell level

Overview of attention for article published in Scientific Reports, November 2016

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In the top 25% of all research outputs scored by Altmetric
Good Attention Score compared to outputs of the same age (79th percentile)
Good Attention Score compared to outputs of the same age and source (73rd percentile)

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twitter: 3 X users

patent: 3 patents

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mendeley: 73 Mendeley
citeulike: 1 CiteULike

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So far, Altmetric has seen 3 patents that reference this research output.

Method for characterizing the deformability of cells or part of the cells of a cellular…

Application FR-3139629-A1

France

METHOD FOR CHARACTERISING THE DEFORMABILITY OF CELLS OR A PORTION OF CELLS IN A CELL…

Application WO-2024052555-A1

World Intellectual Property Organisation (WIPO)

METHOD FOR GRADING THE NUCLEAR MORPHOLOGY OF A TUMOR

Application WO-2022103332-A1

World Intellectual Property Organisation (WIPO)

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