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Mendeley readers
Chapter title |
Prediction of Package Chip Quality Using Fail Bit Count Data of the Probe Test
|
---|---|
Chapter number | 63 |
Book title |
Current Approaches in Applied Artificial Intelligence
|
Published by |
Springer International Publishing, June 2015
|
DOI | 10.1007/978-3-319-19066-2_63 |
Book ISBNs |
978-3-31-919065-5, 978-3-31-919066-2
|
Authors |
Jin Soo Park, Seoung Bum Kim |
Editors |
Moonis Ali, Young Sig Kwon, Chang-Hwan Lee, Juntae Kim, Yongdai Kim |
Mendeley readers
The data shown below were compiled from readership statistics for 5 Mendeley readers of this research output. Click here to see the associated Mendeley record.
Geographical breakdown
Country | Count | As % |
---|---|---|
Unknown | 5 | 100% |
Demographic breakdown
Readers by professional status | Count | As % |
---|---|---|
Unspecified | 1 | 20% |
Other | 1 | 20% |
Student > Doctoral Student | 1 | 20% |
Unknown | 2 | 40% |
Readers by discipline | Count | As % |
---|---|---|
Engineering | 2 | 40% |
Medicine and Dentistry | 1 | 20% |
Unspecified | 1 | 20% |
Unknown | 1 | 20% |