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Development of automated tip preparation for atom probe tomography by using script-controlled FIB-SEM

Overview of attention for article published in Ultramicroscopy, February 2023
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About this Attention Score

  • In the top 25% of all research outputs scored by Altmetric
  • Good Attention Score compared to outputs of the same age (76th percentile)
  • Good Attention Score compared to outputs of the same age and source (72nd percentile)

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