Built-In Self-Test of SFQ Circuits Using Side-Channel Leakage Information
Article in IEEE Transactions on Very Large Scale Integration (VLSI) Systems (April 2024)
The most recent citing publications are shown below. View all 33 publications that cite this research output on Dimensions.
Article in IEEE Transactions on Very Large Scale Integration (VLSI) Systems (April 2024)
Conference proceeding (January 2024)
Article in IEEE Transactions on Very Large Scale Integration (VLSI) Systems (January 2024)