Multipurpose active scanning probe cantilevers for near-field spectroscopy, scanning tunnel imaging, and atomic-resolution lithography

Overview of attention for article published in Journal of Vacuum Science and Technology B, June 2023

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Center for Integrated Nanotechnologies, 13 Jun 2023

Working with CINT — CINT Users present results of using gallium nitride nanowires for scanning tunnel microscopy applications…

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