Physics-informed deep learning for fringe pattern analysis

Overview of attention for article published in Opto-Electronic Advances, January 2024

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Optical metrology, as a general-purpose metrology technique that uses light as information carriers for non-contact and non-destr…

Optical metrology, as a general-purpose metrology technique that uses light as information carriers for non-contact and non-destr…

A new publication from Opto-Electronic Advances, 10.29026/oea.2024.230034 discusses how the synergy of traditional techniques…

image: Fig. 1. Diagrams of the physics-based traditional method, physics-informed deep learning approach, and data-driven deep…

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