You are seeing a free-to-access but limited selection of the activity Altmetric has collected about this research output.
Click here to find out more.
X Demographics
Mendeley readers
Title |
Fatigue Life Prediction of Die-Attach Joint in Power Semiconductors Subjected to Biaxial Stress by High-Speed Thermal Cycling
|
---|---|
Published in |
Materials Transactions, May 2022
|
DOI | 10.2320/matertrans.mt-mc2022006 |
Authors |
Hiroki Kanai, Yoshiharu Kariya, Hiroshige Sugimoto, Yoshiki Abe, Yoshinori Yokoyama, Koki Ochi, Ryuichiro Hanada, Shinnosuke Soda |
X Demographics
The data shown below were collected from the profile of 1 X user who shared this research output. Click here to find out more about how the information was compiled.
Geographical breakdown
Country | Count | As % |
---|---|---|
Unknown | 1 | 100% |
Demographic breakdown
Type | Count | As % |
---|---|---|
Members of the public | 1 | 100% |
Mendeley readers
The data shown below were compiled from readership statistics for 4 Mendeley readers of this research output. Click here to see the associated Mendeley record.
Geographical breakdown
Country | Count | As % |
---|---|---|
Unknown | 4 | 100% |
Demographic breakdown
Readers by professional status | Count | As % |
---|---|---|
Researcher | 1 | 25% |
Unknown | 3 | 75% |
Readers by discipline | Count | As % |
---|---|---|
Engineering | 1 | 25% |
Unknown | 3 | 75% |