Two-dimensional dopant Profiling on Operating MOSFET by Scanning Capacitance Microscopy

Overview of attention for article published in Hyomen Kagaku, January 2007

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学生時代から一貫して見えない内部を知る手段を追求されていたんですね。素晴らしいです。走査型容量顕微鏡によるMOSFET動作時の不純物分布計測 https://t.co/jBpHSJnNQq

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