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Scanning Electron Microscopy and X-Ray Microanalysis

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Cover of 'Scanning Electron Microscopy and X-Ray Microanalysis'

Table of Contents

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    Book Overview
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    Chapter 1 Electron Beam—Specimen Interactions: Interaction Volume
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    Chapter 2 Backscattered Electrons
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    Chapter 3 Secondary Electrons
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    Chapter 4 X-Rays
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    Chapter 5 Scanning Electron Microscope (SEM) Instrumentation
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    Chapter 6 Image Formation
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    Chapter 7 SEM Image Interpretation
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    Chapter 8 The Visibility of Features in SEM Images
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    Chapter 9 Image Defects
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    Chapter 10 High Resolution Imaging
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    Chapter 11 Low Beam Energy SEM
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    Chapter 12 Variable Pressure Scanning Electron Microscopy (VPSEM)
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    Chapter 13 ImageJ and Fiji
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    Chapter 14 SEM Imaging Checklist
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    Chapter 15 SEM Case Studies
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    Chapter 16 Energy Dispersive X-ray Spectrometry: Physical Principles and User-Selected Parameters
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    Chapter 17 DTSA-II EDS Software
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    Chapter 18 Qualitative Elemental Analysis by Energy Dispersive X-Ray Spectrometry
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    Chapter 19 Quantitative Analysis: From k-ratio to Composition
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    Chapter 20 Quantitative Analysis: The SEM/EDS Elemental Microanalysis k-ratio Procedure for Bulk Specimens, Step-by-Step
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    Chapter 21 Trace Analysis by SEM/EDS
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    Chapter 22 Low Beam Energy X-Ray Microanalysis
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    Chapter 23 Analysis of Specimens with Special Geometry: Irregular Bulk Objects and Particles
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    Chapter 24 Compositional Mapping
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    Chapter 25 Attempting Electron-Excited X-Ray Microanalysis in the Variable Pressure Scanning Electron Microscope (VPSEM)
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    Chapter 26 Energy Dispersive X-Ray Microanalysis Checklist
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    Chapter 27 X-Ray Microanalysis Case Studies
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    Chapter 28 Cathodoluminescence
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    Chapter 29 Characterizing Crystalline Materials in the SEM
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    Chapter 30 Focused Ion Beam Applications in the SEM Laboratory
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    Chapter 31 Ion Beam Microscopy
Attention for Chapter 25: Attempting Electron-Excited X-Ray Microanalysis in the Variable Pressure Scanning Electron Microscope (VPSEM)
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Chapter title
Attempting Electron-Excited X-Ray Microanalysis in the Variable Pressure Scanning Electron Microscope (VPSEM)
Chapter number 25
Book title
Scanning Electron Microscopy and X-Ray Microanalysis
Published by
Springer, New York, NY, January 2018
DOI 10.1007/978-1-4939-6676-9_25
Book ISBNs
978-1-4939-6674-5, 978-1-4939-6676-9
Authors

Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W. M. Ritchie, John Henry J. Scott, David C. Joy, Goldstein, Joseph I., Newbury, Dale E., Michael, Joseph R., Ritchie, Nicholas W. M., Scott, John Henry J., Joy, David C.

Mendeley readers

Mendeley readers

The data shown below were compiled from readership statistics for 12 Mendeley readers of this research output. Click here to see the associated Mendeley record.

Geographical breakdown

Country Count As %
Unknown 12 100%

Demographic breakdown

Readers by professional status Count As %
Student > Ph. D. Student 3 25%
Student > Master 2 17%
Researcher 2 17%
Student > Bachelor 1 8%
Student > Postgraduate 1 8%
Other 0 0%
Unknown 3 25%
Readers by discipline Count As %
Arts and Humanities 2 17%
Agricultural and Biological Sciences 2 17%
Environmental Science 1 8%
Business, Management and Accounting 1 8%
Physics and Astronomy 1 8%
Other 2 17%
Unknown 3 25%