Strain and morphology compliance during the intentional doping of high-Al-content AlGaN layers

Overview of attention for article published in Applied Physics Letters, August 2014

Altmetric Badge

Mentioned by

So far, Altmetric has seen 1 X post from an account with 26,758 followers.

Strain and morphology compliance during the intentional doping of high-Al-content AlGaN layers http://t.co/SE7meISc8B

This page shows the most recent X posts that mention this research output.

Click here to find out how to access more activity.