Statistical methods for detecting differentially methylated loci and regions

Overview of attention for article published in Frontiers in Genetics, September 2014

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patent: 2 patents

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So far, Altmetric has seen 2 patents that reference this research output.

METHODS FOR DNA METHYLATION ANALYSIS

Application WO-2022109269-A3

World Intellectual Property Organisation (WIPO)

METHOD OF IDENTIFYING IMPORTANT METHYLOME FEATURES AND USE THEREOF

Application WO-2017136482-A1

World Intellectual Property Organisation (WIPO)

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