You are seeing a free-to-access but limited selection of the activity Altmetric has collected about this research output.
Click here to find out more.
Chapter title |
A Methodology for Worst Case Design of Integrated Circuits
|
---|---|
Chapter number | 44 |
Book title |
The Best of ICCAD
|
Published by |
Springer, Boston, MA, January 2003
|
DOI | 10.1007/978-1-4615-0292-0_44 |
Book ISBNs |
978-1-4613-5007-1, 978-1-4615-0292-0
|
Authors |
A. J. Strojwas, S. R. Nassif, S. W. Director, Strojwas, A. J., Nassif, S. R., Director, S. W. |