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Mendeley readers
| Chapter title |
Package Analysis: SAM and X-ray
|
|---|---|
| Chapter number | 3 |
| Book title |
Failure Analysis of Integrated Circuits
|
| Published by |
Springer, Boston, MA, January 1999
|
| DOI | 10.1007/978-1-4615-4919-2_3 |
| Book ISBNs |
978-1-4613-7231-8, 978-1-4615-4919-2
|
| Authors |
Thomas M. Moore, Cheryl D. Hartfield, Moore, Thomas M., Hartfield, Cheryl D. |
Mendeley readers
The data shown below were compiled from readership statistics for 4 Mendeley readers of this research output. Click here to see the associated Mendeley record.
Geographical breakdown
| Country | Count | As % |
|---|---|---|
| Unknown | 4 | 100% |
Demographic breakdown
| Readers by professional status | Count | As % |
|---|---|---|
| Student > Bachelor | 2 | 50% |
| Student > Ph. D. Student | 1 | 25% |
| Student > Doctoral Student | 1 | 25% |
| Readers by discipline | Count | As % |
|---|---|---|
| Engineering | 3 | 75% |
| Physics and Astronomy | 1 | 25% |