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Reliability Model for MEMS Accelerometers
Novel Algorithms and Techniques In Telecommunications, Automation and Industrial Electronics
Springer, Dordrecht, January 2008
Xingguo Xiong, Yu-Liang Wu, Wen-Ben Jone
The data shown below were compiled from readership statistics for 4 Mendeley readers of this research output. Click here to see the associated Mendeley record.
|Readers by professional status||Count||As %|
|Student > Master||2||50%|
|Student > Ph. D. Student||1||25%|
|Readers by discipline||Count||As %|