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Mendeley readers
Chapter title |
Test Equipment and Measurements
|
---|---|
Chapter number | 9 |
Book title |
Microelectronic Test Structures for CMOS Technology
|
Published by |
Springer, New York, NY, January 2011
|
DOI | 10.1007/978-1-4419-9377-9_9 |
Book ISBNs |
978-1-4419-9376-2, 978-1-4419-9377-9
|
Authors |
Manjul Bhushan, Mark B. Ketchen, Bhushan, Manjul, Ketchen, Mark B. |
Mendeley readers
The data shown below were compiled from readership statistics for 2 Mendeley readers of this research output. Click here to see the associated Mendeley record.
Geographical breakdown
Country | Count | As % |
---|---|---|
Unknown | 2 | 100% |
Demographic breakdown
Readers by professional status | Count | As % |
---|---|---|
Other | 1 | 50% |
Unknown | 1 | 50% |
Readers by discipline | Count | As % |
---|---|---|
Engineering | 1 | 50% |
Unknown | 1 | 50% |