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Infrared Ellipsometry on Semiconductor Layer Structures

Overview of attention for book
Attention for Chapter 11: 4 × 4 Transfer Matrix T p for Magneto-optic Films
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Chapter title
4 × 4 Transfer Matrix T p for Magneto-optic Films
Chapter number 11
Book title
Infrared Ellipsometry on Semiconductor Layer Structures
Published by
Springer, Berlin, Heidelberg, February 2005
DOI 10.1007/978-3-540-44701-6_11
Book ISBNs
978-3-54-023249-0, 978-3-54-044701-6
Authors

Mathias Schubert

Mendeley readers

Mendeley readers

The data shown below were compiled from readership statistics for 9 Mendeley readers of this research output. Click here to see the associated Mendeley record.

Geographical breakdown

Country Count As %
Spain 1 11%
Unknown 8 89%

Demographic breakdown

Readers by professional status Count As %
Student > Ph. D. Student 3 33%
Researcher 3 33%
Student > Master 2 22%
Other 1 11%
Readers by discipline Count As %
Materials Science 5 56%
Physics and Astronomy 3 33%
Engineering 1 11%