↓ Skip to main content
What is this page? Embed badge

Advanced Computing in Electron Microscopy

Overview of attention for book
Cover of 'Advanced Computing in Electron Microscopy'

Table of Contents

  1. Altmetric Badge
    Book Overview
  2. Altmetric Badge
    Chapter 1 Introduction
  3. Altmetric Badge
    Chapter 2 The Transmission Electron Microscope
  4. Altmetric Badge
    Chapter 3 Linear Image Approximations
  5. Altmetric Badge
    Chapter 4 Sampling and the Fast Fourier Transform
  6. Altmetric Badge
    Chapter 5 Calculation of Images of Thin Specimens
  7. Altmetric Badge
    Chapter 6 Theory of Calculation of Images of Thick Specimens
  8. Altmetric Badge
    Chapter 7 Multislice Applications and Examples
  9. Altmetric Badge
    Chapter 8 The Programs
  10. Altmetric Badge
    Chapter 9 Plotting Transfer Functions
  11. Altmetric Badge
    Chapter 10 The Fourier Projection Theorem
  12. Altmetric Badge
    Chapter 11 Atomic Potentials and Scattering Factors
  13. Altmetric Badge
    Chapter 12 Bilinear Interpolation
  14. Altmetric Badge
    Chapter 13 3D Perspective View
Attention for Chapter 8: The Programs
Altmetric Badge

Citations

dimensions_citation
692 Dimensions

Readers on

mendeley
5 Mendeley
Summary Dimensions citations
So far, Dimensions has found 692 publications that cite this research output.

692

The most recent citing publications are shown below. View all 692 publications that cite this research output on Dimensions.

This page shows the most recent citations of this research output.

Click here to find out how to access more activity.

This page is provided by Altmetric.