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VLSI-SoC: Internet of Things Foundations

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Attention for Chapter 2: Efficient Utilization of Test Elevators to Reduce Test Time in 3D-ICs
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Chapter title
Efficient Utilization of Test Elevators to Reduce Test Time in 3D-ICs
Chapter number 2
Book title
VLSI-SoC: Internet of Things Foundations
Published by
Springer, Cham, October 2014
DOI 10.1007/978-3-319-25279-7_2
Book ISBNs
978-3-31-925278-0, 978-3-31-925279-7
Authors

Sreenivaas S. Muthyala, Nur A. Touba, Muthyala, Sreenivaas S., Touba, Nur A.