You are seeing a free-to-access but limited selection of the activity Altmetric has collected about this research output. Click here to find out more.
The Bayes-Optimal Feature Extraction Procedure for Pattern Recognition Using Genetic Algorithm
Artificial Neural Networks – ICANN 2006
Springer, Berlin, Heidelberg, September 2006
Marek Kurzynski, Edward Puchala, Aleksander Rewak
The data shown below were compiled from readership statistics for 2 Mendeley readers of this research output. Click here to see the associated Mendeley record.
|Readers by professional status||Count||As %|
|Readers by discipline||Count||As %|