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Mendeley readers
| Chapter title |
Characterization of Semiconducting Materials
|
|---|---|
| Chapter number | 18 |
| Book title |
Roadmap of Scanning Probe Microscopy
|
| Published by |
Springer, Berlin, Heidelberg, January 2007
|
| DOI | 10.1007/978-3-540-34315-8_18 |
| Book ISBNs |
978-3-54-034314-1, 978-3-54-034315-8
|
| Authors |
Shuji Hasegawa, Masahiko Tomitori |
Mendeley readers
The data shown below were compiled from readership statistics for 2 Mendeley readers of this research output. Click here to see the associated Mendeley record.
Geographical breakdown
| Country | Count | As % |
|---|---|---|
| Unknown | 2 | 100% |
Demographic breakdown
| Readers by professional status | Count | As % |
|---|---|---|
| Unspecified | 1 | 50% |
| Professor > Associate Professor | 1 | 50% |
| Readers by discipline | Count | As % |
|---|---|---|
| Unspecified | 1 | 50% |
| Engineering | 1 | 50% |