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Chapter title |
Digital CMOS Fault Modeling
|
---|---|
Chapter number | 3 |
Book title |
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
|
Published by |
Springer, Boston, MA, January 2007
|
DOI | 10.1007/0-387-46547-2_3 |
Book ISBNs |
978-0-387-46546-3, 978-0-387-46547-0
|
Authors |
Manoj Sachdev, José Pineda de Gyvez |