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Chapter title |
Isothermal defect annealing in semiconductors investigated by time-delayed Mössbauer spectroscopy: application to ZnO
|
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Chapter number | 182 |
Book title |
ICAME 2007
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Published by |
Springer, Berlin, Heidelberg, January 2008
|
DOI | 10.1007/978-3-540-78697-9_182 |
Book ISBNs |
978-3-54-087122-4, 978-3-54-078697-9
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Authors |
H. P. Gunnlaugsson, G. Weyer, R. Mantovan, D. Naidoo, R. Sielemann, K. Bharuth-Ram, M. Fanciulli, K. Johnston, S. Olafsson, G. Langouche, Gunnlaugsson, H. P., Weyer, G., Mantovan, R., Naidoo, D., Sielemann, R., Bharuth-Ram, K., Fanciulli, M., Johnston, K., Olafsson, S., Langouche, G. |