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Introduction to Quantum Metrology

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Attention for Chapter 11: Scanning Probe Microscopes
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Chapter title
Scanning Probe Microscopes
Chapter number 11
Book title
Introduction to Quantum Metrology
Published by
Springer, Cham, January 2015
DOI 10.1007/978-3-319-15669-9_11
Book ISBNs
978-3-31-915668-2, 978-3-31-915669-9
Authors

Waldemar Nawrocki