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Design for Manufacturability and Yield for Nano-Scale CMOS

Overview of attention for book
Attention for Chapter 7: Yield Prediction
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7 Mendeley
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Chapter title
Yield Prediction
Chapter number 7
Book title
Design for Manufacturability and Yield for Nano-Scale CMOS
Published by
Springer, Dordrecht, January 2007
DOI 10.1007/978-1-4020-5188-3_7
Book ISBNs
978-1-4020-5187-6, 978-1-4020-5188-3
Authors

Charles C. Chiang, Jamil Kawa, Chiang, Charles C., Kawa, Jamil

Mendeley readers

Mendeley readers

The data shown below were compiled from readership statistics for 7 Mendeley readers of this research output. Click here to see the associated Mendeley record.

Geographical breakdown

Country Count As %
Pakistan 1 14%
Unknown 6 86%

Demographic breakdown

Readers by professional status Count As %
Student > Ph. D. Student 2 29%
Unspecified 1 14%
Student > Doctoral Student 1 14%
Lecturer > Senior Lecturer 1 14%
Student > Bachelor 1 14%
Other 1 14%
Readers by discipline Count As %
Agricultural and Biological Sciences 6 86%
Unspecified 1 14%