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Soft Errors in Modern Electronic Systems

Overview of attention for book
Cover of 'Soft Errors in Modern Electronic Systems'

Table of Contents

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    Book Overview
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    Chapter 1 Soft Errors from Space to Ground: Historical Overview, Empirical Evidence, and Future Trends
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    Chapter 2 Single Event Effects: Mechanisms and Classification
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    Chapter 3 JEDEC Standards on Measurement and Reporting of Alpha Particle and Terrestrial Cosmic Ray Induced Soft Errors
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    Chapter 4 Gate Level Modeling and Simulation
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    Chapter 5 Circuit and System Level Single-Event Effects Modeling and Simulation
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    Chapter 6 Hardware Fault Injection
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    Chapter 7 Integrated Circuit Qualification for Space and Ground-Level Applications: Accelerated Tests and Error-Rate Predictions
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    Chapter 8 Circuit-Level Soft-Error Mitigation
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    Chapter 9 Software-Level Soft-Error Mitigation Techniques
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    Chapter 10 Specification and Verification of Soft Error Performance in Reliable Electronic Systems
Attention for Chapter 10: Specification and Verification of Soft Error Performance in Reliable Electronic Systems
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Citations

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Chapter title
Specification and Verification of Soft Error Performance in Reliable Electronic Systems
Chapter number 10
Book title
Soft Errors in Modern Electronic Systems
Published by
Springer, Boston, MA, January 2011
DOI 10.1007/978-1-4419-6993-4_10
Book ISBNs
978-1-4419-6992-7, 978-1-4419-6993-4
Authors

Allan L. Silburt, Adrian Evans, Ana Burghelea, Shi-Jie Wen, David Ward, Ron Norrish, Dean Hogle, Ian Perryman

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Mendeley readers

Mendeley readers

The data shown below were compiled from readership statistics for 2 Mendeley readers of this research output. Click here to see the associated Mendeley record.

Geographical breakdown

Country Count As %
Unknown 2 100%

Demographic breakdown

Readers by professional status Count As %
Student > Ph. D. Student 2 100%
Readers by discipline Count As %
Physics and Astronomy 1 50%
Engineering 1 50%

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