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Hardware and Software: Verification and Testing

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Cover of 'Hardware and Software: Verification and Testing'

Table of Contents

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    Book Overview
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    Chapter 1 Hazards of Verification
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    Chapter 2 Automata-Theoretic Model Checking Revisited
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    Chapter 3 Proofs, Interpolants, and Relevance Heuristics
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    Chapter 4 Is Verification Getting Too Complex?
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    Chapter 5 Can Mutation Analysis Help Fix Our Broken Coverage Metrics?
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    Chapter 6 Practical Considerations Concerning HL-to -RT Equivalence Checking
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    Chapter 7 A Framework for Inherent Vacuity
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    Chapter 8 A Meta Heuristic for Effectively Detecting Concurrency Errors
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    Chapter 9 A Uniform Approach to Three-Valued Semantics for μ -Calculus on Abstractions of Hybrid Automata
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    Chapter 10 Automatic Boosting of Cross-Product Coverage Using Bayesian Networks
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    Chapter 11 Efficient Decision Procedure for Bounded Integer Non-linear Operations Using SMT( $\mathcal{LIA}$ )
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    Chapter 12 Evaluating Workloads Using Comparative Functional Coverage
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    Chapter 13 Iterative Delta Debugging
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    Chapter 14 Linear-Time Reductions of Resolution Proofs
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    Chapter 15 Significant Diagnostic Counterexamples in Probabilistic Model Checking
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    Chapter 16 Statistical Model Checking of Mixed-Analog Circuits with an Application to a Third Order Δ  −  Σ Modulator
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    Chapter 17 Structural Contradictions
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    Chapter 18 Synthesizing Test Models from Test Cases
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    Chapter 19 d-TSR : Parallelizing SMT-Based BMC Using Tunnels over a Distributed Framework
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    Chapter 20 Progress in Automated Software Defect Prediction
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    Chapter 21 SeeCode – A Code Review Plug-in for Eclipse
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    Chapter 22 User-Friendly Model Checking: Automatically Configuring Algorithms with RuleBase/PE
Attention for Chapter 4: Is Verification Getting Too Complex?
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Chapter title
Is Verification Getting Too Complex?
Chapter number 4
Book title
Hardware and Software: Verification and Testing
Published by
Springer, Berlin, Heidelberg, October 2008
DOI 10.1007/978-3-642-01702-5_4
Book ISBNs
978-3-64-201701-8, 978-3-64-201702-5
Authors

Yoav Hollander, Hollander, Yoav

View on publisher site

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