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Fabrication and Characterization in the Micro-Nano Range

Overview of attention for book
Attention for Chapter 8: Nano Characterization of Structures by Focused Ion Beam (FIB) Tomography
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Citations

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Chapter title
Nano Characterization of Structures by Focused Ion Beam (FIB) Tomography
Chapter number 8
Book title
Fabrication and Characterization in the Micro-Nano Range
Published by
Springer, Berlin, Heidelberg, January 2011
DOI 10.1007/978-3-642-17782-8_8
Book ISBNs
978-3-64-217781-1, 978-3-64-217782-8
Authors

Flavio Andrés Soldera, Fernando Adrián Lasagni, Frank Mücklich, Soldera, Flavio Andrés, Lasagni, Fernando Adrián, Mücklich, Frank

Mendeley readers

Mendeley readers

The data shown below were compiled from readership statistics for 6 Mendeley readers of this research output. Click here to see the associated Mendeley record.

Geographical breakdown

Country Count As %
Unknown 6 100%

Demographic breakdown

Readers by professional status Count As %
Researcher 3 50%
Lecturer 1 17%
Professor 1 17%
Student > Postgraduate 1 17%
Readers by discipline Count As %
Materials Science 3 50%
Engineering 2 33%
Unspecified 1 17%