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Mendeley readers
Chapter title |
Subsurface Defects in Silicon Investigated by Modulated Optical Reflectance Measurements
|
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Chapter number | 158 |
Book title |
Review of Progress in Quantitative Nondestructive Evaluation
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Published by |
Springer, Boston, MA, January 1989
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DOI | 10.1007/978-1-4613-0817-1_158 |
Book ISBNs |
978-1-4612-8097-2, 978-1-4613-0817-1
|
Authors |
Jeff Bailey, Eicke Weber, Jon Opsal, Bailey, Jeff, Weber, Eicke, Opsal, Jon |
Mendeley readers
The data shown below were compiled from readership statistics for 1 Mendeley reader of this research output. Click here to see the associated Mendeley record.
Geographical breakdown
Country | Count | As % |
---|---|---|
Unknown | 1 | 100% |
Demographic breakdown
Readers by professional status | Count | As % |
---|---|---|
Librarian | 1 | 100% |
Readers by discipline | Count | As % |
---|---|---|
Physics and Astronomy | 1 | 100% |