↓ Skip to main content

The Characteristics of Seebeck Coefficient in Silicon Nanowires Manufactured by CMOS Compatible Process

Overview of attention for article published in Discover Nano, July 2010
Altmetric Badge

About this Attention Score

  • Average Attention Score compared to outputs of the same age and source

Mentioned by

patent
2 patents

Readers on

mendeley
33 Mendeley