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Secondary Electron Yield of Nano-Thick Aluminum Oxide and its Application on MCP Detector
Proceedings of International Conference on Technology and Instrumentation in Particle Physics 2017
Springer, Singapore, May 2017
Baojun Yan, Shulin Liu, Kaile Wen, Yuzhen Yang, Tianchi Zhao, Peiliang Wang, Yuekun Heng
The data shown below were compiled from readership statistics for 2 Mendeley readers of this research output. Click here to see the associated Mendeley record.
|Readers by professional status||Count||As %|
|Student > Doctoral Student||1||50%|
|Readers by discipline||Count||As %|